Transistor having vertical channel

ABSTRACT

A semiconductor device including vertical channel transistor and a method for forming the transistor, which can significantly decrease the resistance of a word line is provided. A vertical channel transistor includes a substrate including pillars each of which has a lower portion corresponding to a channel region. A gate insulation layer is formed over the substrate including the pillars. A metal layer having a low resistance is used for forming a surrounding gate electrode to decrease resistance of a word line. A barrier metal layer is formed between a gate insulation layer and a surrounding gate electrode so that deterioration of characteristics of the insulation layer is prevented. A world line is formed connecting gate electrodes formed over the barrier layer to surround the lower portion of each pillar.

CROSS-REFERENCE TO RELATED APPLICATION

The present invention is a divisional of U.S. patent application Ser.No. 12/165,427 filed on Jun. 30, 2008, which claims priority of Koreanpatent application number 10-2008-0018439 filed on Feb. 28, 2008, bothof which are incorporated by reference in their entirety.

BACKGROUND OF THE INVENTION

The present invention relates to a method for fabricating asemiconductor device, and more particularly, to a transistor having avertical channel in the semiconductor device and a method forfabricating the same.

Recently, a research on a transistor having a vertical channel isactively progressed to increase the degree of integration ofsemiconductor devices.

FIG. 1A illustrates a plane view of a typical transistor having avertical channel and FIG. 1B illustrates a cross-sectional view of acell taken along a line A-A′ in FIG. 1A. The plane view in FIG. 1A istaken along plane cut out the line A-A′ while maintaining a height of adotted line in FIG. 1B.

Referring to FIGS. 1A and 1B, a plurality of semiconductor pillars P isformed over a substrate 11. A pillar P includes a substrate material andhas a portion which is vertically protruding from the substrate 11.Furthermore, as shown in FIG. 1A, the pillars P are arranged in a firstdirection and a second direction crossing the first direction. Thepillar P has an upper part, a middle part and a lower part. In otherwords, the pillar P has a drain region D, a channel region C, and asource region S. The channel region C connects the drain region D andthe source region S.

An electrode 13 is formed surrounding outside of the middle part of thepillar P, the channel region C. An insulation layer 12 is formed betweenthe surrounding electrode 13 and the pillar P. A damascene word line 14is formed extending along the first direction while electricallyconnecting neighboring surrounding electrodes on sidewalls of thesurrounding electrode 13. The reference numerals 15 and 16 represent afirst inter-layer insulation layer and a second inter-layer insulationlayer, respectively.

In a semiconductor device including the transistor that has the abovementioned vertical channel structures, a word line is formed with thesurrounding electrodes 13 and the damascene word line 14. In suchsemiconductor device, a width of the damascene word line 14 is limitedby the surrounding electrodes 13. Thus, resistance of the word line isdetermined by the surrounding electrodes 13.

Since the surrounding electrodes 13 and the damascene word line 14 aregenerally formed of polysilicon, the resistance of the word line ishighly increased.

SUMMARY OF THE INVENTION

Embodiments of the present invention are directed to provide a verticalchannel transistor and a method for forming the transistor, which cansignificantly decrease resistance of a word line by forming a barriermetal layer between a gate insulation layer and a surrounding electrodewhile using a metal layer having a low resistance as the surroundinggate electrode. The barrier metal layer prevents deterioration ofcharacteristics of the insulation layer.

In accordance with an aspect of the present invention, there is provideda semiconductor device including vertical channel transistors. Thesemiconductor device includes a substrate including pillars each ofwhich has a lower portion horizontally recessed to a certain width,wherein the lower portion corresponds to a channel region of thevertical channel. The semiconductor device further includes aninsulation layer formed over the substrate including the pillars and abarrier layer formed over a portion of the insulation layercorresponding to the lower portion of each pillar. A gate electrode isformed over the barrier layer, surrounding the lower portion of eachpillar and a word line is formed connecting the gate electrodessurrounding the pillars.

In accordance with another aspect of the present invention, there isprovided a method for fabricating a semiconductor device includingvertical channel transistors. The method includes providing a substrateincluding pillars each of which has a lower portion recessed to acertain width, wherein the lower part corresponds to a channel region ofa vertical channel transistor. The method includes forming a gateinsulation layer over a surface of the substrate including the pillars,thereby forming a first resultant structure, and forming a barrier layerover a portion of the insulation layer corresponding to the lowerportion of each pillar. A gate electrode is formed over the barrierlayer, surrounding the lower portion of each pillar, thereby forming asecond resultant structure, and forming a word line to connect the gateelectrodes formed over the pillars.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1A illustrates a plane view of a typical transistor having avertical channel.

FIG. 1B illustrates a cross-sectional view of a cell taken along theline A-A′ in FIG. 1A.

FIG. 2A illustrates a plane view of a transistor having a verticalchannel in a semiconductor device in accordance with an embodiment ofthe present invention.

FIG. 2B illustrates a cross-sectional view of a cell taken along theline A-A′ in FIG. 2A.

FIG. 3 illustrates a graph comparing word line resistance changes in atypical word line and a word line in accordance with the presentinvention according to different design rules.

FIGS. 4A and 4B illustrate graphs comparing current-voltage (I-V)characteristics of an insulation layer according to existence andnonexistence of tantalum nitride (TaN) layer as a barrier metal layer.

FIGS. 5A to 5J illustrate cross-sectional views of a method forfabricating a transistor having a vertical channel in a semiconductordevice in accordance with an embodiment of the present invention.

DESCRIPTION OF SPECIFIC EMBODIMENTS

Hereinafter, a semiconductor device with a vertical channel transistorand a method for fabricating the same in accordance with the presentinvention will be described in detail with reference to the accompanyingdrawings.

FIG. 2A illustrates a plane view of a transistor having a verticalchannel in a semiconductor device in accordance with an embodiment ofthe present invention and FIG. 2B illustrates a cross-sectional view ofa cell taken along the line A-A′ in FIG. 2A. The plane view in FIG. 2Ais taken by cutting the semiconductor device along a dotted line in FIG.2B.

Referring to FIGS. 2A to 2B, a plurality of semiconductor pillars(hereinafter, pillars) P is formed over a substrate 21. The pillar Pincludes a substrate material and has a portion which is verticallyprotruding from the substrate 21. As shown in FIG. 2A, the pillars P arearranged in a first direction and a second direction crossing the firstdirection. A pillar P has an upper part, a middle part and a lower part.In other words, the pillar P has a drain region D, a channel region C,and a source region S. The channel region C connects the drain region Dand the source region S.

In one embodiment, an electrode 24 is formed surrounding the outside ofthe middle part of the pillar P, the channel region C, and a firstinsulation layer 22 is formed between the electrode 24 and the pillar P,wherein the electrode 24 is a surrounding electrode for a gate. Thesurrounding gate electrode 24 is desirably formed of a metal layerhaving a low resistance. The metal layer includes one selected from agroup consisting of titanium nitride (TiN), aluminum (Al), copper (Cu)and a combination thereof.

The metal layer for forming the surrounding gate electrode 24 is formedby a method of forming a layer having a good step-coveragecharacteristic because of the nature of a structure of the transistorhaving the vertical channel. Such a method may be a sequential flowdeposition (SFD) method or an atomic layer deposition (ALD) method. Whenthe pillar P is vertically protruding from the substrate 21, a sidewallof the pillar P is recessed to a given depth. The surrounding gateelectrode 24 is formed to fill the recessed portion of the pillar P. Adepth of the surrounding gate electrode 24 is variable in accordancewith a width of the pillar P.

However, the performance of the first insulation layer 22 can bedeteriorated while forming the metal layer with the SFD method or theALD method. A barrier metal layer 23 is formed between the firstinsulation layer 22 and the surrounding gate electrode 24 in order toprevent the above mentioned limitation. The barrier metal layer 23includes one selected from a group consisting of tantalum nitride (TaN),tantalum carbide nitride (TaCN) and a combination thereof. More detailswill be described with reference to FIGS. 4A and 4B.

In one embodiment, a damascene word line 26 is formed extending alongthe first direction while electrically connecting adjacent surroundinggate electrodes 24. The damascene word line 26 connects on one side ofthe surrounding gate electrodes 24. The damascene word line 26 includesa metal layer having a low resistance. It is desirable to form thedamascene word line 26 with a tungsten (W) layer which can be thicklyformed without a crack. An inter-layer insulation layer 27 is formedover sidewalls of the damascene word line 26 and under the damasceneword line 26. However, since the W layer has a bad adhesive property tothe inter-layer insulation layer 27, an adhesive layer 25 is formed overthe sidewalls of the damascene word line 26 and under the damascene wordline 26. In one embodiment, the adhesive layer 25 includes a TiN layer.The reference numerals 28 represents an inter-layer insulation layerformed after forming the damascene word line 26.

FIG. 3 illustrates a graph comparing word line resistance changes in atypical word line and a word line in accordance with an embodiment ofthe present invention.

In FIG. 3, TiN is used as an example of metal for the surrounding gateelectrode of the word line in an embodiment of the present invention.Polysilicon is used for the surrounding gate electrode of the word linein a conventional vertical channel transistor.

As shown, when TiN is applied to the surrounding gate electrode inaccordance with an embodiment of the present invention, word lineresistance is significantly lower than when polysilicon is applied tothe surrounding gate electrode according to the typical method. Forexample, the word line having a TiN layer has world line resistance thatis approximately one-fifth to approximately one-tenth of the word lineresistance in the typical word line.

Furthermore, a difference between the resistance of the typical wordline and the resistance of the word line in accordance with anembodiment of the present invention is getting much bigger as the designrules are decreased. Thus, when the TiN layer is used as the surroundinggate electrode, it has many advantages.

However, when a metal layer such as a TiN layer is used as a surroundinggate electrode, characteristics of the insulation layer still can bedeteriorated because a SFD method or an ALD method is applied to formthe metal layer in order to ensure step coverage characteristics. Thus,a barrier metal layer such as a TaN layer is formed between the metallayer and an insulation layer in embodiments of the present invention.

FIGS. 4A and 4B illustrate graphs comparing current-voltage (I-V)characteristics of an insulation layer according to existence andnonexistence of a barrier metal layer. The graphs are obtained byseveral experiments. Specifically, a TaN layer is used as the barriermetal layer in FIGS. 4A and 4B.

Referring to FIG. 4A, it is shown that a leakage current is sharplyincreased when a TiN layer as a surrounding gate electrode is directlyformed on an insulation layer (without a barrier layer). The reason ofsharp increasing of the leakage current is due to diffusion ofimpurities into the insulation layer. When the TiN layer is formed witha SFD method or an ALD method in order to ensure step coveragecharacteristics of the TiN layer Chlorine (Cl) impurities are generatedfrom tetrachlorotitanium (TiCl₄) used for depositing the TiN layer. As aresult, the Cl impurities can be contained in the TiN layer. The Climpurities contained in the TiN layer can reach the insulation layer andit has an effect on the insulation layer. The above described phenomenoncan be caused as well even if another metal layer is deposited in lieuof the TiN layer.

However, referring to FIG. 4B, when a TaN layer is formed as a barriermetal layer between the insulation layer and the TiN layer, it is shownthat a leakage current is much lower than when a TiN layer (used as asurrounding gate electrode) is directly formed on the insulation layer.Herein, the thickness of the TaN layer is approximately 50 Å and thethickness of the TiN layer is approximately 200 Å.

That is, referring to FIGS. 4A and 4B, when the TaN layer is formed asthe barrier metal layer, the gate leakage current can maintainapproximately 10⁻⁸ A/cm² while voltage applied is up to approximately−5.5 V. On the other hand, when the TiN layer is formed as the barriermetal layer, the gate leakage current is upper than 10⁻⁸ A/cm².

In this manner, the leakage current can be substantially reduced sincethe Cl impurities contained in the TiN layer cannot reach the insulationlayer due to the barrier metal layer.

In one embodiment, the metal layer having a low resistance is used toform the surrounding gate electrode, and the barrier metal layer isformed between the surrounding gate electrode and the insulation layerto prevent diffusion of impurities into the insulation layer. In such anembodiment, the metal layer is formed by the SFD method or the ALDmethod to acquire good step coverage characteristics while thedeterioration of characteristics of the insulation layer can beprevented. Herein, the metal layer includes a TiN layer and the barriermetal layer includes a TaN layer.

FIGS. 5A to 5J illustrate cross-sectional views of a method forfabricating a transistor having a vertical channel in a semiconductordevice in accordance with an embodiment of the present invention. Thecross-sectional views in FIGS. 5A to 5J are taken along the line A-A′ inFIG. 2A.

Referring to FIG. 5A, a hard mask pattern 52 is formed over a substrate51 to form a semiconductor pillar. A plurality of hard mask patterns isarranged along the first direction and the second direction as shown inFIG. 2A. The hard mask pattern 52 may have a stack structure of an oxidelayer 52A and a nitride layer 52B. The substrate 51 is etched to a firstdepth using the hard mask pattern 52 as an etch barrier, thereby formingan upper part of the semiconductor pillar. Then, spacers 53 are formedon sidewalls of the hard mask pattern 52 and the upper part of thesemiconductor pillar. A first exposed portion of the substrate 51 afterforming the spacers is further etched to a second depth using the hardmask pattern 52 and the spacers 53 as an etch barrier, thereby forming alower part of the semiconductor pillar.

Referring to FIG. 5B, a second exposed portion of the substrate 51 afterforming the lower part of the semiconductor pillar is isotropicallyetched using the hard mask pattern 52 and the spacers 53 as an etchbarrier so that the lower part of the semiconductor pillar is recessed.In another embodiment of the present invention, the lower port of thesemiconductor pillar may not be recessed. As a result, the semiconductorpillar P having an active region is formed to include an upper part, amiddle part and a lower part. The upper part and the lower part aresource/drain regions S/D and the middle part is a channel region Cconnecting the drain region D and the source region S. In FIGS. 5B to5J, although the upper part and the lower part are represented as thedrain region D and the source region S, respectively, the upper part andthe lower part could be the source region S and the drain region D,respectively.

In FIG. 5B, a reference numeral 51A represents a first etched substrate51A formed after performing the isotropic etching on the substrate 51. Afirst insulation layer 54 is formed over a portion of the first etchedsubstrate 51A not covered by the hard mask pattern 52 and the spacers53, thereby forming a first resultant structure.

Referring to FIG. 5C, a barrier metal layer 55 is formed over the firstresultant structure. In one embodiment, the barrier metal layer 55includes one selected from a group consisting of TaN, tantalum carbidenitride (TaCN) and a combination thereof. The barrier metal layer 55 hasa thickness ranging from approximately 30 Å to approximately 100 Å.

A metal layer 56 for a surrounding gate electrode is formed over thebarrier metal layer 55. The metal layer 56 includes one selected from agroup consisting of TiN, aluminum (Al), copper (Cu) and a combinationthereof. As described above, in some embodiments, the metal layer 56 isformed by a SFD method or an ALD method in order to ensure step coveragecharacteristics. A thickness of the metal layer 56 is approximately 50 Åto approximately 300 Å.

Referring to FIG. 5D, a dry etching process is performed on the metallayer 56 using the hard mask patterns 52 and the spacers 53 as an etchbarrier until the first insulation layer 54 on the first etchedsubstrate 51A is exposed. As a result, an etched metal layer 56A for thesurrounding gate electrode and an etched barrier metal layer 55A areformed under the drain region D, surrounding the channel region C.Hereinafter, the etched metal layer 56A surrounding the channel region Cis referred to as a metal surrounding gate electrode.

Referring to FIG. 5E, a capping layer 57 is formed over a secondresultant including the metal surrounding gate electrode 56A in order toprotect the metal surrounding gate electrode 56A. The capping layer 57includes a nitride layer and a thickness ranging from approximately 50 Åto approximately 70 Å. A first inter-layer insulation layer 58 is formedover the capping layer 57. In one embodiment, the first inter-layerinsulation layer 58 includes an oxide layer.

Referring to FIG. 5F, a photoresist pattern (not shown) is formed overthe first inter-layer insulation layer 58 so as to form a trench fordevice isolation. The first inter-layer insulation layer 58, the cappinglayer 57 and the first etched substrate 51A are etched to a given depthusing the photoresist pattern as an etch mask. Thus, trenches for deviceisolation T1 are formed between the pillars P arranged along the seconddirection and the trenches T1 are formed extending in the seconddirection. Herein, the depth of the trench T1 ranges from approximately1,000 Å to approximately 2,000 Å. Reference numerals 51B, 54A, 57A and58A represent a second etched substrate, an etched insulation layer, afirst etched capping layer and a first etched first inter-layerinsulation layer, respectively, formed after the trench T1 is formed.

Referring to FIG. 5G, a surface of an exposed portion of the secondetched substrate 51B by the trench T1 is oxidized, thus an oxide layer59 is formed. The thickness of the oxide layer 59 ranges fromapproximately 20 Å to approximately 50 Å. A second inter-layerinsulation layer 60 is formed to fill the trench T1. A reference numeral51C represents a partially oxidized substrate by performing an oxidationprocess on the exposed portion of the second etched substrate 51B.

Referring to FIG. 5H, a photoresist pattern (not shown) is formed overthe first etched first inter-layer insulation layer 58A so as to form atrench for a word line. The first etched first inter-layer insulationlayer 58A, the second inter-layer insulation layer 60 and the firstetched capping layer 57A are removed up to a level lower than a topsurface of the metal surrounding gate electrode 56A. Thus, a trench forword line T2 is formed exposing a portion of one side of the metalsurrounding gate electrode 56A and extending in the first direction.Reference numerals 57B, 58B and 60A represent a second etched cappinglayer, a second etched first inter-layer insulation layer and a firstetched second inter-layer insulation layer, respectively, formed afterperforming an etch process on the first etched capping layer 57A, thefirst etched first inter-layer insulation layer 58A and the secondinter-layer insulation layer 60.

Referring to FIG. 5I, an adhesive layer 61 is formed over a thirdresultant structure including the trench T2 in order to increaseadhesion to a subsequent word line and insulation layers such as thesecond etched first inter-layer insulation layer 58B and the firstetched second inter-layer insulation layer 60A. As mentioned above, itis desirable to form the adhesive layer 61 with a TiN layer.

A conductive layer 62 is formed over a fourth resultant structureincluding the adhesive layer 61. The conductive layer 62 is formed withthe thickness as much as sufficiently covering and filling the trenchT2. It is more desirable to form the conductive layer 62 with a W layer.

Referring to FIG. 5J, the conductive layer 62 and the adhesive layer 61are etched to a level corresponding to the top of the metal surroundinggate electrode 56A. Thus, a damascene word line 62A is formed to extendin the first direction and electrically connect the metal surroundinggate electrodes 56A. A reference numeral 61A represents an etchedadhesive layer formed by performing the etch process on the adhesivelayer.

While the present invention has been described with respect to thespecific embodiments, the above embodiments of the present invention areillustrative and not limitative. It will be apparent to those skilled inthe art that various changes and modifications may be made withoutdeparting from the spirit and scope of the invention as defined in thefollowing claims.

What is claimed is:
 1. A semiconductor device including vertical channeltransistors, comprising: a substrate including a plurality of pillarseach of which has a lower portion, wherein the lower portion correspondsto a channel region of a vertical channel transistor; an insulationlayer formed over the substrate including the plurality of pillars; abarrier layer formed over a portion of the insulation layercorresponding to the lower portion of each pillar; a gate electrodeformed over the barrier layer to surround the lower portion of eachpillar; a first trench extending into the substrate between adjacentones of the plurality of pillars; an inter-layer insulation layerfilling the first trench; and a second trench formed over theinter-layer insulation layer, the second trench including a word linecoupled to the gate electrodes surrounding the plurality of pillars. 2.The device as recited in claim 1, wherein the lower portion has arecessed type, wherein a width of the lower portion is less than that ofan upper portion of the pillars.
 3. The device as recited in claim 1,wherein the gate electrode comprises a metal electrode.
 4. The device asrecited in claim 1, wherein the barrier layer comprises TaN and the gateelectrode comprises TiN.
 5. The device as recited in claim 1, furthercomprising an adhesive layer formed on sidewalls of the word line andunder the word line.
 6. The device as recited in claim 1, wherein thebarrier layer has a thickness ranging from approximately 30 Å toapproximately 100 Å.
 7. The device as recited in claim 1, wherein theword line comprises metal.
 8. The device as recited in claim 7, whereinthe adhesive layer comprises a TiN layer.
 9. The device as recited inclaim 1, wherein the barrier layer includes a metal-nitride layercontaining of tantalum (Ta) and nitride (N).
 10. The device as recitedin claim 9, wherein the metal-nitride layer comprises one selected froma group consisting of tantalum nitride (TaN), tantalum carbide nitride(TaCN) and a combination thereof.
 11. The device as recited in claim 9,wherein the metal electrode comprises one selected from a groupconsisting of titanium nitride (TiN), aluminium (Al), copper (Cu) and acombination thereof.
 12. The device as recited in claim 11, wherein theword line comprises a tungsten (W) layer.
 13. A semiconductor deviceincluding vertical channel transistors, comprising: a plurality ofpillars formed over a substrate, each pillar having a lower portioncorresponding to a channel region of a vertical channel transistor; agate insulation layer formed over the substrate including the pluralityof pillars; a barrier layer formed over a portion of the insulationlayer corresponding to the lower portion of each pillar, wherein thebarrier layer includes a metal-nitride layer containing tantalum (Ta)and nitride (N); a metal gate electrode formed by selectively etching ametal layer formed over the barrier layer, the metal gate electrodesurrounding the lower portion of each pillar; a first trench extendinginto the substrate between adjacent ones of the plurality of pillars; aninter-layer insulation layer filling the first trench; and a secondtrench formed over the inter-layer insulation layer, the second trenchincluding a word line coupled to the metal gate electrodes.
 14. Thedevice as recited in claim 13, wherein the metal-nitride layer comprisesone selected from a group consisting of tantalum nitride (TaN), tantalumcarbide nitride (TaCN) and a combination thereof.